Materials characterization

The basis for for process and system developments is a fundamental understanding of the dielectric properties of the materials involved. For appropriate characterization different measurement methods are used and continuously developed and expanded with new measurement methods. Currently, various test stands are available:  

• Coaxial probe for measurements of lossy materials 
  (0.5 to 20 GHz frequency range, temperature range up to 150°C)

• Transmission / reflection measurement method inside WR340 waveguide 
  (2.45 GHz, temperature range up to 200°C)

• Resonator method for low-loss materials 
  (2.45 GHz, temperature range up to 1200°C)